Accueil > Plates-formes > Le Centre de Photonique pour la biologie et les matériaux (CPBM) > E AFM TIRF
E AFM TIRF
par - 20 juillet 2022
This microscope is a unique combination of experimental approaches based on microscopy techniques :
(1) Scanning probe microscopy, AFM (Atomic Force Microscopy) and its derived electrical modes as Scanning Electro-Chemical mode (SECM) or the new Electro-Mechanical Scanning Microscopy mode (EMSM, see below). They could be used to quantify biomolecules adhesion forces and discriminate electrostatic interactions ;
(2) fluorescence imaging techniques with ultrahigh spatial resolution as TIRF (Total Internal Reflection Fluorescence) set-up for optimal imaging of the bacteria/surface interface and quantification of bio-adhesion to surfaces.
The current development of the system focuses on the so-called "electric" AFM modes in order to produce a nanometric mapping of surface charges. More precisely, it involves analyzing by AFM the heterogeneity of the structural, mechanical and electrical properties of the observed sample or simulating the interactions by modifying either the nature of the solid substrate on which the samples are immobilized, or that of the AFM tip, either by modifying their chemical constitution or even the surface electric charge state by varying, for example, the electric potentials applied to the various electrodes used (substrate, AFM cantilever, etc.)